The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Dec. 21, 2022
Applicant:

Kokusai Electric Corporation, Tokyo, JP;

Inventors:

Arito Ogawa, Toyama, JP;

Atsuro Seino, Toyama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/285 (2006.01); C23C 16/34 (2006.01); C23C 16/52 (2006.01); H01L 21/768 (2006.01); C23C 16/455 (2006.01); C23C 16/458 (2006.01); H01L 21/28 (2006.01); H01L 21/02 (2006.01); C23C 16/44 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28568 (2013.01); C23C 16/34 (2013.01); C23C 16/52 (2013.01);
Abstract

There is provided a method of manufacturing a semiconductor device, including forming a metal nitride film substantially not containing a silicon atom on a substrate by sequentially repeating: (a) supplying a metal-containing gas and a reducing gas, which contains silicon and hydrogen and does not contain a halogen, to the substrate in a process chamber by setting an internal pressure of the process chamber to a value which falls within a range of 130 Pa to less than 3,990 Pa during at least the supply of the reducing gas, wherein (a) includes a timing of simultaneously supplying the metal-containing gas and the reducing gas; (b) removing the metal-containing gas and the reducing gas that remain in the process chamber; (c) supplying a nitrogen-containing gas to the substrate; and (d) removing the nitrogen-containing gas remaining in the process chamber.


Find Patent Forward Citations

Loading…