The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jan. 04, 2021
Applicant:

Carl Zeiss Sms Ltd., D.N. Misgav, IL;

Inventors:

Joachim Welte, Darmstadt, DE;

Uri Stern, Kiryat Tivon, IL;

Kujan Gorhad, Northern Region, IL;

Vladimir Dmitriev, Tzurit, IL;

Assignee:

Carl Zeiss SMS Ltd., D.N. Misgav, IL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F 1/84 (2012.01); G03F 1/80 (2012.01);
U.S. Cl.
CPC ...
G03F 1/84 (2013.01); G01N 2201/06113 (2013.01); G01N 2201/062 (2013.01); G03F 1/80 (2013.01);
Abstract

The present invention refers to a method for determining an effect of one or more of pixels to be introduced into a substrate of a photolithographic mask, the photolithographic mask having one or more pattern elements, wherein the one or more pixels serve to at least partly correct one or more errors of the photolithographic mask, the method comprising: determining the effect of the one or more introduced pixels by determining a change in birefringence of the substrate of the photolithographic mask having the one or more pattern elements.


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