The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Sep. 23, 2021
Applicant:

Rigaku Corporation, Akishima, JP;

Inventor:

Koichiro Ito, Tokyo, JP;

Assignee:

RIGAKU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01M 10/05 (2010.01); H01M 10/48 (2006.01); G01N 23/20 (2018.01); G01N 23/20041 (2018.01); H01M 10/0562 (2010.01); G01N 23/2055 (2018.01); G01N 23/20033 (2018.01);
U.S. Cl.
CPC ...
G01N 23/20041 (2013.01); G01N 23/2055 (2013.01); H01M 10/0562 (2013.01); H01M 10/48 (2013.01); G01N 23/20033 (2013.01); G01N 2223/056 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/307 (2013.01); G01N 2223/3106 (2013.01); G01N 2223/317 (2013.01); Y02E 60/10 (2013.01);
Abstract

A structure for pressurization analysis includes a sample accommodating unit () for accommodating an all-solid-state battery (S) therein, and a pressurizing unit () having a pressurizing mechanism for causing pressure to act on the all-solid-state battery (S). The all-solid-state battery (S) is pressurized inside the sample accommodating unit () while being sandwiched between a pressure receiving member () and a pressing member (). Further, an X-ray window () is provided in an outer radial direction orthogonal to an acting direction of the pressure from the pressurizing unit (), and reflection type X-ray diffraction measurement can be performed through the X-ray window ().


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