The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 27, 2024

Filed:

Jan. 23, 2023
Applicant:

Trustees of Boston University, Boston, MA (US);

Inventors:

Ji-Xin Cheng, Newton, MA (US);

JIan Zhao, Boston, MA (US);

Lei Tian, Newton, MA (US);

Alex Matlock, Brighton, MA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/63 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/636 (2013.01); G01N 2021/637 (2013.01); G01N 2021/655 (2013.01);
Abstract

An example microscope includes a pump laser for providing a first illumination to a sample. A laser array provides a second illumination to the sample. The laser array may include a plurality of laser elements, each providing oblique illuminations to the sample. An illumination collecting source collects the first illumination and the second illumination from the sample. The illumination collecting source may capture transient 3D refractive index (RI) variations in the sample due to the first illumination and second illumination.


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