The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Mar. 23, 2022
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
John E. Riley, McKinney, TX (US);
Scott E. Smith, Plano, TX (US);
Jennifer E. Taylor, Boise, ID (US);
Gary L. Howe, Allen, TX (US);
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/4076 (2006.01); G11C 11/4096 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4076 (2013.01); G11C 11/4096 (2013.01);
Abstract
Methods, apparatuses, and systems related to operations for managing the quality of an input signal received by a device and for providing feedback in real-time. A controller can provide a reference signal to the device for the input quality check. The memory can implement the input quality check by counting the number of transitions of the reference signal for a set time period and store the resulting count value(s). The memory can use the count value(s) to determine a condition or a quality for the reference signal.