The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Apr. 16, 2019
Applicant:

Koh Young Technology Inc., Seoul, KR;

Inventors:

Choung Min Jung, Siheung-si, KR;

Ho Jun Lee, Bucheon-si, KR;

Nam Kyu Park, Namyangju-si, KR;

Han Rim Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/01 (2006.01); G01N 21/88 (2006.01); G06T 7/40 (2017.01); H04N 23/695 (2023.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01N 21/01 (2013.01); G01N 21/88 (2013.01); G06T 7/40 (2013.01); H04N 23/695 (2023.01); G01N 2021/0106 (2013.01); G01N 2021/0187 (2013.01); G06T 2207/30108 (2013.01);
Abstract

An object inspection apparatus according to an embodiment disclosed herein includes: a first flipper apparatus configured to rotate a first object; a second flipper apparatus configured to rotate a second object; and a single camera device configured to move from a position corresponding to one of the first flipper apparatus and the second flipper apparatus to a position corresponding to the other, the camera device being configured to inspect object surfaces of the first object and the second object. Each of the first flipper apparatus and the second flipper apparatus includes at least one flipper unit.


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