The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Jun. 30, 2016
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Anbang Yao, Beijing, CN;

Yiwen Guo, Beijing, CN;

Yurong Chen, Beijing, CN;

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/082 (2023.01); G06F 18/241 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
U.S. Cl.
CPC ...
G06N 3/082 (2013.01); G06F 18/241 (2023.01); G06V 10/764 (2022.01); G06V 10/82 (2022.01);
Abstract

Systems, apparatuses and methods may provide for conducting an importance measurement of a plurality of parameters in a trained neural network and setting a subset of the plurality of parameters to zero based on the importance measurement. Additionally, the pruned neural network may be re-trained. In one example, conducting the importance measurement includes comparing two or more parameter values that contain covariance matrix information.


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