The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 20, 2024
Filed:
Sep. 01, 2021
Intel Corporation, Santa Clara, CA (US);
Albert Schmitz, Beaverton, OR (US);
Anne Matsuura, Portland, OR (US);
Ravi Pillarisetty, Portland, OR (US);
Shavindra Premaratne, Portland, OR (US);
Justin Hogaboam, Aloha, OR (US);
Lester Lampert, Portland, OR (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Apparatus and method for measurement-free (MF) quantum error correction (QEC). For example, one embodiment of a method comprises: determining an error syndrome on a first subset of ancilla qubits of a quantum processor; decoding the error syndrome to produce decoded results on a second subset of ancilla qubits of the quantum processor; applying the decoded results to one or more system qubits; and unconditionally resetting the first subset and/or second subset of ancilla qubits to remove entropy and/or noise from the quantum system, wherein the operations of determining the error syndrome, decoding the error syndrome, applying the error syndrome, and unconditionally resetting the first and/or second subset of ancilla qubits are performed responsive to a qubit controller executing quantum control instructions provided from or derived from a script and without transmitting measurement data related to the error syndrome to a non-quantum computing device.