The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 20, 2024

Filed:

Mar. 16, 2021
Applicant:

HI Llc, Los Angeles, CA (US);

Inventors:

Sebastian Sorgenfrei, Playa Vista, CA (US);

Ryan Field, Culver City, CA (US);

Bruno Do Valle, Brighton, MA (US);

Isai Olvera, San Jose, CA (US);

Jacob Dahle, Arlington, MA (US);

Husam Katnani, Braintree, MA (US);

Assignee:

HI LLC, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0082 (2013.01); A61B 5/4064 (2013.01); A61B 5/6803 (2013.01); A61B 5/7217 (2013.01); A61B 2560/0223 (2013.01); A61B 2560/0443 (2013.01); A61B 2562/046 (2013.01);
Abstract

An illustrative optical measurement system includes a light source configured to emit light directed at a target, an array of photodetectors configured to detect photons of the light after the light is scattered by the target, and a processing unit. The processing unit is configured to measure a noise level of a photodetector included in the array of photodetectors and determine that the noise level meets a predetermined threshold. The processing unit is further configured to prevent, based on the determining that the noise level meets the predetermined threshold, an output of the photodetector from being used in generating a histogram based on a temporal distribution of photons detected by the array of photodetectors.


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