The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Aug. 26, 2020
Applicant:

Kioxia Corporation, Minato-ku, JP;

Inventors:

Hiroshi Yoshimura, Yokohama, JP;

Kazuyuki Hino, Yokohama, JP;

Jiro Higuchi, Yokohama, JP;

Sachiyo Ito, Kawasaki, JP;

Ken Furubayashi, Yokohama, JP;

Assignee:

Kioxia Corporation, Minato-ku, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); G06F 30/398 (2020.01); G06F 30/20 (2020.01);
U.S. Cl.
CPC ...
H01L 21/76838 (2013.01); G06F 30/20 (2020.01); G06F 30/398 (2020.01);
Abstract

In general, according to one embodiment, a stress analysis method comprising: dividing a surface of an object into a plurality of first rectangles each having a first size, on data; and acquiring a first type value for each of the first rectangles. The method further includes: specifying, from among the first rectangles, a plurality of second rectangles that have the first type value of a magnitude that falls within a first range and form a rectangle; and generating a stress model for a set of the second rectangles by using the second rectangles as an element.


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