The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jun. 11, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Chris Carpenter, Sunnyvale, CA (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/02 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0253 (2013.01); G06F 3/0608 (2013.01); G06F 3/0644 (2013.01); G06F 3/0679 (2013.01);
Abstract

In a closed-loop garbage collection system a comparator receives a first target time indicating when a first superblock of memory is expected to be filled based on a first write rate for a first write cursor writing data units into the first superblock. The comparator further receives a negative loop feedback based on one or more elements from the garbage collection process. The comparator determines a first garbage collection rate based on the first target time and the negative loop feedback, where the first garbage collection rate is calculated to provide a free empty superblock to the first write cursor within a range of time of the first target time. The comparator sends instructions to a garbage collection manager to perform a garbage collection process at the first garbage collection rate, wherein an outcome of the garbage collection process is incorporated into the negative loop feedback sent to the comparator.


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