The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2024
Filed:
Jan. 28, 2021
Advantest Corporation, Tokyo, JP;
Chi Yuan, San Jose, CA (US);
Srdjan Malisic, San Jose, CA (US);
Advantest Corporation, Tokyo, JP;
Abstract
Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, an enhanced auxiliary interface test system comprises a load board, testing electronics, controller, and memory mapped interface. The load board is configured to couple with a plurality of devices under test (DUTs). The testing electronics is configured to test the plurality of DUTs, wherein the testing electronics are coupled to the load board. The controller is configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics. The memory mapped interface is configured to implement multiple paths to access a central processing unit (CPU) on the controller and enable testing of multiple DUTs in parallel.