The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Jul. 23, 2021
Applicant:

Ebara Corporation, Tokyo, JP;

Inventors:

Toru Maruyama, Tokyo, JP;

Mitsunori Komatsu, Tokyo, JP;

Keisuke Kamiki, Tokyo, JP;

Assignee:

EBARA CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M 3/28 (2006.01); B24B 37/005 (2012.01); G01M 3/18 (2006.01); G01M 3/26 (2006.01);
U.S. Cl.
CPC ...
G01M 3/2807 (2013.01); B24B 37/005 (2013.01); G01M 3/18 (2013.01); G01M 3/182 (2013.01); G01M 3/183 (2013.01); G01M 3/26 (2013.01); G01M 3/28 (2013.01); G01M 3/2846 (2013.01);
Abstract

A method of inspecting a leak detection system in a short time is disclosed. The leak detection system includes a leak detection line, an on-off valve, a flow mater, an operation controller configured to detect a fluid leak from a fluid line based on a first flow rate measured by the flow mater, a drain line, and a drain valve attached to the drain line. The inspection method includes: opening the on-off valve and the drain valve, with a supply valve and a return valve closed; measuring a second flow rate of fluid in the leak detection line by the flow mater; and determining that the leak detection system has a defect when the second flow rate is lower than a predetermined reference value.


Find Patent Forward Citations

Loading…