The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2024

Filed:

Aug. 20, 2021
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Siegfried Alexander Tromp, Knegsel, NL;

Antonie Hendrik Verweij, Dussen, NL;

Abraham Alexander Soethoudt, Eindhoven, NL;

Jan Pieter Van De Poel, Hendrik Ido Ambacht, NL;

Mark Constant Johannes Baggen, Eindhoven, NL;

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F16C 32/06 (2006.01); H01L 21/683 (2006.01); F16C 29/02 (2006.01); G03F 7/00 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
F16C 32/0611 (2013.01); F16C 29/025 (2013.01); F16C 32/0607 (2013.01); G03F 7/20 (2013.01); G03F 7/707 (2013.01); G03F 7/708 (2013.01); H01L 21/6831 (2013.01); H01L 21/6833 (2013.01);
Abstract

A support table for a lithographic apparatus, a method of loading a substrate, a lithographic apparatus and a method for manufacturing a device using a lithographic apparatus. In one arrangement, a support table is configured to support a substrate. The support table has a base surface. The base surface faces a surface of the substrate when the substrate is supported by the support table. One or more gas cushion members are provided above the base surface. Each of the gas cushion members includes a recess. The recess is shaped and configured such that a lowering of the substrate into a position on the support table at which the substrate is supported by the support table causes a localised build-up of pressure within the recess. The localized build-up of pressure provides a localised gas cushioning effect during the lowering of the substrate.


Find Patent Forward Citations

Loading…