The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Apr. 29, 2022
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Erika Penzo, San Jose, CA (US);

Henry Chin, Fremont, CA (US);

Jie Liu, Milpitas, CA (US);

Dong-Il Moon, San Jose, CA (US);

Assignee:

SANDISK TECHNOLOGIES LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/06 (2006.01); G11C 16/34 (2006.01); G11C 16/26 (2006.01); G11C 16/24 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
G11C 16/349 (2013.01); G11C 16/0483 (2013.01); G11C 16/24 (2013.01); G11C 16/26 (2013.01);
Abstract

An apparatus disclosed herein comprises: a plurality of memory cells and a control circuit coupled to the plurality of memory cells. The control circuit is configured to: acquire a first set of read levels on a wordline of a first block of pages of memory cells; acquire a second set of read levels on a first wordline of a second block of pages of a second set of memory cells in response to determining that the fail bit count of the page after a read operation is above the threshold amount; and acquire a third set of read levels on a second wordline of the second block in response to determining that the fail bit count of the page after the second read operation is above the threshold amount.


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