The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2024

Filed:

Sep. 21, 2021
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Takasumi Ikebe, Kanagawa, JP;

Kenji Goto, Kanagawa, JP;

Mayfor Dangkiw, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/319 (2006.01); G01R 29/26 (2006.01); G01R 23/20 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2822 (2013.01); G01R 23/20 (2013.01); G01R 29/26 (2013.01); G01R 31/31905 (2013.01);
Abstract

A receiving device includes a reception unit that samples a sample signal from a DUT; an FFT processing unitthat performs an FFT process by multiplying the sample signal by a window function; an FFT length setting unitthat, when the signal length of the signal to be measured is shorter than the first FFT length conforming to the communication standard, instead of the first FFT length, sets a second FFT length shorter than the signal length of the signal to be measured, as an FFT length of the FFT process; and a window function setting unitthat, when the signal length of the signal to be measured is shorter than the first FFT length, instead of a first window function, sets an asymmetric second window function having a peak separated from a center of a window section, as the window function.


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