The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Aug. 17, 2021
Applicant:

Infineon Technologies Ag, Neubiberg, DE;

Inventors:

Reinhard Ploss, Unterhaching, DE;

Hans-Joachim Schulze, Taufkirchen, DE;

Assignee:

Infineon Technologies AG, Neubiberg, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/06 (2006.01); H01L 21/04 (2006.01); H01L 21/225 (2006.01); H01L 21/263 (2006.01); H01L 21/265 (2006.01); H01L 21/3065 (2006.01); H01L 21/324 (2006.01); H01L 29/16 (2006.01); H01L 21/3115 (2006.01); H01L 29/32 (2006.01); H01L 29/167 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0634 (2013.01); H01L 21/046 (2013.01); H01L 21/0455 (2013.01); H01L 21/0475 (2013.01); H01L 21/2253 (2013.01); H01L 21/2255 (2013.01); H01L 21/263 (2013.01); H01L 21/26513 (2013.01); H01L 21/3065 (2013.01); H01L 21/324 (2013.01); H01L 29/16 (2013.01); H01L 29/1608 (2013.01); H01L 21/31155 (2013.01); H01L 29/167 (2013.01); H01L 29/32 (2013.01);
Abstract

A method of forming a semiconductor device includes forming a trench in a semiconductor body; at least partially filling the trench with a filling material; introducing dopants into a portion of the filling material; and applying a first thermal processing to the semiconductor body to spread the dopants in the filling material along a vertical direction of the filling material by a diffusion process. The vertical doping profile of the dopants within the doped filling material is shaped during the first thermal processing. Additionally, the dopants are substantially confined to within the trench and substantially do not diffuse from the doped filling material into the semiconductor body during the first thermal processing. A second thermal processing is applied to the semiconductor body after the first thermal processing to cause diffusion of the dopants from the doped filling material into the semiconductor body adjoining the trench.


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