The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Aug. 26, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Keita Kato, Haibara-gun, JP;

Michihiro Shirakawa, Haibara-gun, JP;

Akiyoshi Goto, Haibara-gun, JP;

Takashi Kawashima, Haibara-gun, JP;

Masafumi Kojima, Haibara-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/004 (2006.01); C07C 381/12 (2006.01); C07D 295/26 (2006.01); C07D 327/08 (2006.01); C07D 333/46 (2006.01); C08L 25/06 (2006.01); C08L 33/06 (2006.01); C08L 33/08 (2006.01); C08L 33/16 (2006.01); G03F 7/115 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G03F 7/0045 (2013.01); C07C 381/12 (2013.01); C07D 295/26 (2013.01); C07D 327/08 (2013.01); C07D 333/46 (2013.01); C08L 25/06 (2013.01); C08L 33/064 (2013.01); C08L 33/08 (2013.01); C08L 33/16 (2013.01); G03F 7/115 (2013.01); G03F 7/2053 (2013.01);
Abstract

The present invention provides an actinic ray-sensitive or radiation-sensitive resin composition with which a pattern having an excellent pattern collapse suppressing property and excellent LWR performance can be obtained. In addition, the present invention also provides a resist film, a pattern forming method, and a method for manufacturing an electronic device, each regarding the actinic ray-sensitive or radiation-sensitive resin composition. The actinic ray-sensitive or radiation-sensitive resin composition of the present invention includes a resin whose solubility in a developer is changed by the action of an acid, a photoacid generator represented by General Formula (b1), and a solvent, in which the photoacid generator represented by General Formula (b1) is a compound that generates an acid having a pka of 1.0 or less upon irradiation with actinic rays or radiation


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