The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Sep. 19, 2019
Applicants:

Yokogawa Electric Corporation, Tokyo, JP;

Hosei University, Tokyo, JP;

Inventors:

Yoshinori Matsumoto, Tokyo, JP;

Hiroaki Tanaka, Tokyo, JP;

Jun Katsuyama, Tokyo, JP;

Mitsuru Shinagawa, Tokyo, JP;

Assignees:

Yokogawa Electric Corporation, Musashino, JP;

Hosei University, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/035 (2006.01); G02F 1/295 (2006.01); G02B 6/12 (2006.01); G01R 29/08 (2006.01); G02F 1/03 (2006.01); G02F 1/225 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0885 (2013.01); G02F 1/0305 (2013.01); G02F 1/225 (2013.01);
Abstract

An electric field sensor which measures an electric field generated by a target utilizing an electro-optic effect, the electric field sensor including a light source, an electro-optic crystal on which light in a predetermined polarization state emitted from the light source is incident and which is subjected to the electric field generated by the target, a reference electric field applicator configured to apply an electric field based on a reference signal with a known signal level to the electro-optic crystal, a light receiver configured to receive light emitted from the electro-optic crystal and to convert the received light into an electric signal, and a separation corrector configured to separate the electric signal into a measurement signal based on the electric field generated by the target and the reference signal and to correct a signal level of the measurement signal on the basis of the signal level of the separated reference signal.


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