The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Jun. 28, 2021
Applicant:

Lumentum Operations Llc, San Jose, CA (US);

Inventors:

Sean Burns, Menlo Park, CA (US);

Raman Srinivasan, San Jose, CA (US);

Lucas Morales, San Francisco, CA (US);

Tian Shi, Fremont, CA (US);

Yuanzhen Zhuang, San Jose, CA (US);

Cho-Shuen Hsieh, Zhubei, TW;

Albert Huang, Taoyuan, TW;

Assignee:

Lumentum Operations LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/073 (2006.01); G01R 1/067 (2006.01);
U.S. Cl.
CPC ...
G01R 1/07342 (2013.01); G01R 1/06761 (2013.01);
Abstract

In some implementations, a probe tip assembly includes a driver printed circuit board assembly (PCBA) and a probe tip subassembly. The probe tip subassembly includes a plurality of probe tips, wherein a probe tip, of the plurality of probe tips, extends beyond an end of the PCBA, and the PCBA and the probe tip are configured to transmit an electric signal to test an optical component. The probe tip may include a material comprising at least one of copper (Cu), a beryllium copper (BeCu) alloy, tungsten (W), Paliney, Neyoro, and/or another conductive material.


Find Patent Forward Citations

Loading…