The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2024

Filed:

Jul. 09, 2020
Applicant:

Jeol Ltd., Tokyo, JP;

Inventor:

Makoto Asakura, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/10 (2006.01); B01L 3/00 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/1004 (2013.01); B01L 3/52 (2013.01); B01L 13/00 (2019.08); G01N 35/00584 (2013.01); G01N 35/1002 (2013.01); G01N 35/1009 (2013.01); G01N 2035/00534 (2013.01);
Abstract

An automated analyzer including: a stirring part provided with a stirring bar; a cleaning part that cleans the stirring bar; and a control unit that controls the stirring part and the cleaning part, when the control unit causes the stirring part to stir a liquid containing a specimen in a second cycle subsequent to a first cycle, the control unit performing first processing that sets a range of the stirring bar to be cleaned in the second cycle as a cleaning range R, and when the control unit does not cause the stirring part to stir the liquid in the second cycle, the control unit performing second processing that sets a range of the stirring bar to be cleaned in at least one of the first cycle and the second cycle as a cleaning range Rthat is wider than the cleaning range R


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