The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2024
Filed:
Aug. 26, 2021
Ihi Corporation, Tokyo, JP;
Toshiaki Hamano, Tokyo, JP;
IHI CORPORATION, Tokyo, JP;
Abstract
An ultrasonic flaw detection device (A) includes: an ultrasonic probe () that emits ultrasonic waves to an inspection object (P) and detects reflected waves; a sheet material () attached to a surface of the inspection object and having two-dimensional patterns, the two-dimensional patterns being arranged on the inspection object and indicating positions on the inspection object; an imaging device () attached to the ultrasonic probe and imaging the two-dimensional patterns (); and a processing unit () that reads position information indicating a position on the inspection object from a captured image captured by the imaging device and relates a detection result of the ultrasonic probe to the position information, wherein the processing unit determines an index indicating the degree of quality of the detection result based on an air pocket area (HA) that is an area in which air pockets are shown in a predetermined area (H) of the captured image.