The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 09, 2024
Filed:
Jun. 22, 2022
Changxin Memory Technologies, Inc., Hefei, CN;
Xikun Chu, Hefei, CN;
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Abstract
Provided are a method for testing a memory, an apparatus for testing a memory, a computer-readable storage medium, and an electronic device, which relate to the field of integrated circuit technology. The method for testing a memory includes: writing first data into each of memory cells of a memory array; enabling a data mask mode, and writing second data into each of the memory cells of the memory array; enabling a leakage mode, and writing the first data into a memory cell corresponding to a column under test of the memory array; and after preset leakage time, disabling the leakage mode, and reading data from the memory cell corresponding to the column under test for testing, to determine whether there are at least two columns simultaneously turned on in the memory array. This method may test whether a row decoder fails.