The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 09, 2024

Filed:

Nov. 16, 2020
Applicant:

Advantest Corporation, Tokyo, JP;

Inventor:

Eddy Wayne Chow, San Jose, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 31/319 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 1/0441 (2013.01); G01R 31/31905 (2013.01); G01R 31/318519 (2013.01);
Abstract

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a test system configuration adapter includes a tester side socket, a break out pin, and a device under test (DUT) side slot. The tester side socket is configured to couple with a test equipment socket. The break out pin is configured to couple with the supplemental equipment. The DUT side slot is configured to couple with the tester side socket, the break out pin, and a DUT. The test system configuration adapter is configured to enable communication between test equipment coupled to the test equipment socket and supplemental equipment coupled to the breakout pin while the DUT remains coupled to the DUT side slot. The breakout pin and tester side socket can be selectively coupled to the DUT side slot.


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