The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Sep. 28, 2020
Applicant:

Samsung Display Co., Ltd., Yongin-Si, KR;

Inventors:

Jinsuk Lee, Yongin-si, KR;

Jin Jeon, Yongin-si, KR;

Sugwoo Jung, Yongin-si, KR;

Shinbeom Choi, Yongin-si, KR;

Youngin Hwang, Yongin-si, KR;

Byungno Kim, Yongin-si, KR;

Heeyeon Kim, Yongin-si, KR;

Kohei Ebisuno, Yongin-si, KR;

Nalae Lee, Yongin-si, KR;

Illhwan Lee, Yongin-si, KR;

Jongmin Lee, Yongin-si, KR;

Joohyeon Jo, Yongin-si, KR;

Changha Kwak, Yongin-si, KR;

Yongseon Jo, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-Si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/32 (2006.01); H10K 59/121 (2023.01); H10K 77/10 (2023.01); H01L 27/12 (2006.01); H01L 29/786 (2006.01); H10K 59/12 (2023.01); H10K 102/00 (2023.01);
U.S. Cl.
CPC ...
H10K 59/1213 (2023.02); H10K 77/111 (2023.02); H01L 27/1218 (2013.01); H01L 27/1262 (2013.01); H01L 29/78603 (2013.01); H10K 59/1201 (2023.02); H10K 2102/311 (2023.02);
Abstract

Provided are a thin film transistor substrate which include a substrate, a buffer layer and a thin film transistor, a display apparatus including the thin film transistor substrate, and a method of manufacturing the display apparatus including the thin film transistor substrate. The buffer layer includes an inorganic insulating layer. An area ratio of a peak corresponding to an N—H bond in the buffer layer is 0.5% or less based on a total peak area in a Fourier transform infrared spectroscopy (FTIR).


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