The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Nov. 25, 2020
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Taisei Inoue, Koshi, JP;

Hiroki Sakurai, Koshi, JP;

Takashi Nakazawa, Koshi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3213 (2006.01); C23F 1/30 (2006.01); H01L 21/67 (2006.01);
U.S. Cl.
CPC ...
H01L 21/32134 (2013.01); C23F 1/30 (2013.01); H01L 21/6715 (2013.01); H01L 21/67248 (2013.01); H01L 21/67253 (2013.01);
Abstract

A substrate processing apparatus includes a temperature detector, a calculation unit and an execution unit. The temperature detector is configured to detect a temperature of a substrate on which a processing liquid is discharged. The calculation unit is configured to calculate, by using a given calculation formula, an etching amount of the substrate based on the temperature detected by the temperature detector. The execution unit configured to perform an etching processing on the substrate by the processing liquid based on the etching amount.


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