The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Mar. 12, 2021
Applicant:

Changxin Memory Technologies, Inc., Hefei, CN;

Inventors:

Hao He, Hefei, CN;

Dan Lu, Hefei, CN;

Yang Wang, Hefei, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/56004 (2013.01); G11C 29/56016 (2013.01); G11C 2029/5602 (2013.01);
Abstract

The present disclosure relates to a memory test system and a memory test method. The memory test system comprises: a plurality of test devices, a host computer, and driving modules. Each of the test devices is provided with a test interface used for connecting a memory to be tested. The host computer is respectively connected to the plurality of test devices and configured to control the test devices to test the memory to be tested. The driving modules are connected to the test devices and configured to output, to the test devices, driving signals used for driving the test devices to perform data interaction with the host computer.


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