The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Jun. 29, 2021
Applicant:
Synopsys, Inc., Mountain View, CA (US);
Inventors:
Ankush B. Oberai, Fremont, CA (US);
Kiran U. Agashe, Mumbai, IN;
Assignee:
Synopsys, Inc., Sunnyvale, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/27 (2020.01); G06F 30/394 (2020.01); G06F 30/392 (2020.01); G06F 119/02 (2020.01);
U.S. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 30/27 (2020.01); G06F 30/392 (2020.01); G06F 30/394 (2020.01); G06F 2119/02 (2020.01);
Abstract
For each defect in a set of defects, the defect may be associated with a defect attribute constructed from a set of computer-aided design (CAD) identifiers associated with polygons in an integrated circuit (IC) design that overlap with a defect area of the defect. Next, the set of defects may be segregated into defect groups based on the associated defect attributes. The defect groups may be used to perform additional processing on the set of defects.
Oberai, Ankush. (2024). Segregating defects based on computer-aided design (cad) identifiers associated with the defects (U.S. Patent No. 11861286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11861286
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile