The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Aug. 05, 2021
Applicant:
Changxin Memory Technologies, Inc., Hefei, CN;
Inventor:
Xiaofeng Xu, Hefei, CN;
Assignee:
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2273 (2013.01); G06F 11/2205 (2013.01);
Abstract
A memory test method, a memory test apparatus, a device and a storage medium are provided. The memory test method includes: obtaining a central processing unit (CPU) accessible space of a memory to-be-tested; obtaining a graphics processing unit (GPU) accessible space of the memory to-be-tested; and driving a CPU to run a test program based on the accessible space of the CPU, to access the memory to-be-tested through a bus of memory to-be-tested, when the CPU runs the test program, the CPU controls a GPU to access the memory to-be-tested based on the accessible space of the GPU through the bus of memory to-be-tested.