The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Sep. 30, 2021
Changxin Memory Technologies, Inc., Hefei, CN;
Fan Xu, Hefei, CN;
CHANGXIN MEMORY TECHNOLOGIES, INC., Hefei, CN;
Abstract
A method for testing crosstalk effect includes: obtaining a test signal and an interference input signal; inputting the test signal into a crosstalk effect test circuit obtained by simulation, so as to obtain an interfered signal; and when a rise time of the interfered signal or a fall time of the interfered signal is greater than a preset time threshold, determining that an excessive crosstalk effect exists in an integrated circuit under test. The crosstalk effect test circuit includes a first circuit, N second circuits, and N capacitors. The first circuit is configured to simulate an interfered first signal circuit in the integrated circuit under test; the N second circuits are configured to simulate N second signal circuits that interfere with the first signal circuit in the integrated circuit under test.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile