The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 2024

Filed:

Jul. 21, 2022
Applicant:

Anritsu Corporation, Kanagawa, JP;

Inventors:

Shigeo Arai, Kanagawa, JP;

Eiji Taniguchi, Kanagawa, JP;

Takashi Suzuki, Kanagawa, JP;

Assignee:

ANRITSU CORPORATION, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/84 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9508 (2013.01); G01N 21/8806 (2013.01); G01N 2021/845 (2013.01);
Abstract

To provide an article inspection apparatus capable of sensitively and stably detecting a change in a spectrum when an unspecified foreign substance is contained and determining a defective product. A transport unit that transports a tablet for inspection to an article inspection position, a light irradiation unit that irradiates the tablet transported to the article inspection position with light, a light detection unit that detects light transmitted through the tablet, and an article inspection unit that inspects a quality of the tablet based on spectral characteristics of the light detected by the light detection unit are provided, and the article inspection unit standardizes a measured value of a spectrum of the light detected by the light detection unit for each wavelength and determines whether the tablet is a normal product or a defective product based on a standardized value.


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