The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 02, 2024
Filed:
Mar. 16, 2021
Applicant:
HI Llc, Los Angeles, CA (US);
Inventors:
Ryan Field, Culver City, CA (US);
Bruno Do Valle, Brighton, MA (US);
Jacob Dahle, Arlington, MA (US);
Sebastian Sorgenfrei, Playa Vista, CA (US);
Assignee:
HI LLC, Los Angeles, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/7214 (2013.01); A61B 5/0082 (2013.01); A61B 5/6803 (2013.01); A61B 2562/0238 (2013.01); A61B 2562/046 (2013.01); A61B 2576/026 (2013.01);
Abstract
An exemplary optical measurement system includes a signal generator configured to generate a signal and a processing unit configured to direct the signal generator to apply the signal to a component within the optical measurement system, generate, based on a response of the component to the signal, characterization data representative of a timing uncertainty associated with the component, and perform, based on the characterization data, an action associated with the component.