The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Jan. 18, 2023
Applicant:

Taiwan Semiconductor Manufacturing Company Ltd., Hsinchu, TW;

Inventors:

Sai-Hooi Yeong, Hsinchu County, TW;

Chih-Yu Chang, New Taipei, TW;

Chun-Yen Peng, Hsinchu, TW;

Chi On Chui, Hsinchu, TW;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/33 (2006.01); H01G 13/00 (2013.01); H01L 49/02 (2006.01); H01G 4/20 (2006.01); H01G 4/08 (2006.01);
U.S. Cl.
CPC ...
H01L 28/60 (2013.01); H01G 4/08 (2013.01); H01G 4/20 (2013.01); H01G 13/00 (2013.01);
Abstract

A MIM structure and manufacturing method thereof are provided. The MIM structure includes a substrate and a metallization structure over the substrate. The metallization structure includes a bottom electrode layer, a dielectric layer on the bottom electrode layer, a ferroelectric layer on the dielectric layer, a top electrode layer on the ferroelectric layer, a first contact electrically coupled to the top electrode layer, and a second contact penetrating the dielectric layer and the ferroelectric layer, electrically coupled to a base portion of the bottom electrode layer. The bottom electrode layer includes the base portion and a plurality of protrusions, each of the protrusions is protruding from the base portion and leveled with a lower surface of the dielectric layer, each portion of the dielectric layer over the bottom electrode layer substantially have identical thicknesses.


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