The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Jul. 02, 2020
Applicants:

Fudan University, Shanghai, CN;

Shanghai Integrated Circuit Manufacturing Innovation Center Co., Ltd, Shanghai, CN;

Inventors:

Bao Zhu, Shanghai, CN;

Lin Chen, Shanghai, CN;

Qingqing Sun, Shanghai, CN;

Wei Zhang, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01); H10B 12/00 (2023.01); H01L 23/00 (2006.01); H01L 25/065 (2023.01);
U.S. Cl.
CPC ...
H01L 23/481 (2013.01); H01L 24/11 (2013.01); H01L 24/14 (2013.01); H01L 25/0652 (2013.01); H10B 12/01 (2023.02); H10B 12/30 (2023.02); H01L 2224/17104 (2013.01);
Abstract

Disclosed is a three-dimensional integrated system for DRAM chips and a fabrication method thereof. A plurality of trench structures are etched on the front and back of a silicon wafer; then, a TSV structure is etched between the two upper and lower trenches opposite to each other for electrical connection; then, DRAM chips are placed in the trenches, and copper-copper bonding is used to make the chips electrically connected to the TSV structure in a vertical direction; finally, redistribution is done to make the chips in a horizontal direction electrically connected. The invention can make full use of silicon materials, and can avoid problems such as warpage and deformation of an interposer. In addition, placing the chips in the trenches will not increase the overall package thickness, while protecting the chips from external impact.


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