The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 26, 2023

Filed:

Dec. 01, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Honglin Sun, Boise, ID (US);

Glen E. Hush, Boise, ID (US);

Richard C. Murphy, Boise, ID (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 40/70 (2022.01); H01L 27/118 (2006.01); G06N 3/045 (2023.01); G06N 3/065 (2023.01); G06V 10/764 (2022.01); G06N 3/08 (2023.01);
U.S. Cl.
CPC ...
G06V 40/70 (2022.01); G06N 3/045 (2023.01); G06N 3/065 (2023.01); G06V 10/764 (2022.01); H01L 27/11807 (2013.01); G06N 3/08 (2013.01); H01L 2027/11838 (2013.01);
Abstract

Systems, apparatuses, and methods related to comparison of biometric identifiers in memory are described. An example apparatus includes an array of memory cells, a plurality of logic blocks in complementary metal-oxide-semiconductor (CMOS) under the array, and a controller coupled to the array of memory cells. The controller is configured to control a first portion of the plurality of logic blocks to receive a first subset of a set of biometric identifiers from the array and to perform a first comparison operation thereon and control a second portion of the logic blocks to receive a second subset of the set of biometric identifiers from the array and to perform a second comparison operation thereon. The first and second subsets of the biometric identifiers are different biometric identifiers and the first and second comparison operations are performed to determine a match of the first and second subsets respectively to a stored template.


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