The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Aug. 31, 2021
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventor:
Hyunui Lee, Seoul, KR;
Assignee:
Micron Technology, Inc., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/04 (2006.01); G11C 29/12 (2006.01); G11C 29/02 (2006.01); G11C 7/10 (2006.01); G11C 29/56 (2006.01);
U.S. Cl.
CPC ...
G11C 29/1201 (2013.01); G11C 7/1051 (2013.01); G11C 7/1078 (2013.01); G11C 29/022 (2013.01); G11C 2029/5602 (2013.01); G11C 2207/2254 (2013.01);
Abstract
Semiconductor devices are disclosed. A semiconductor device may include a number of impedance calibration circuits and an interpolation circuit. The interpolation circuit may be configured to generate a calibration code based on two or more other calibration codes generated via one or more impedance calibration circuits of the number of impedance calibration circuits, another interpolation circuit, or any combination thereof. Methods and systems are also disclosed.