The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 19, 2023
Filed:
Jul. 20, 2020
Zhejiang University, Hangzhou, CN;
Jian Bai, Hangzhou, CN;
Lei Zhao, Hangzhou, CN;
Binjie Lu, Hangzhou, CN;
Xiangdong Zhou, Hangzhou, CN;
Jing Hou, Hangzhou, CN;
Zhejiang University, Zhejiang, CN;
Abstract
The present disclosure provides an apparatus and method for wavefront reconstruction based on rotationally symmetric extended structured light illumination. The apparatus includes a laser device, a neutral density filter, a microscope objective, a pinhole, a collimating lens, a beam splitter prism, a spatial light modulator, a lens to be measured, and an image acquisition device that are sequentially arranged. The method permits modulation of incident parallel light into phase grating-like structured light by using a spatial light modulator. Based on the characteristic of non-infinitely small pixel unit of the spatial light modulator, changing the modulation pattern of the spatial light modulator may result in different forms of structured light. Not only the object to be measured but also the real structured light wavefront can be recovered by acquiring diffraction spots at the focal plane and simultaneously updating the object plane and the structured light plane using an algorithm.