The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Sep. 02, 2022
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Seungjune Jeon, Santa Clara, CA (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/14 (2006.01); G11C 16/34 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G11C 29/765 (2013.01); G06F 11/1076 (2013.01); G06F 11/1402 (2013.01); G11C 16/3404 (2013.01); G11C 29/52 (2013.01); G06F 2201/85 (2013.01);
Abstract

An apparatus includes an error read flow component resident on a memory sub-system. The error read flow component can cause performance of a plurality of read recovery operations on a group of memory cells that are programmed or read together, or both. The error read flow component can determine whether a particular read recovery operation invoking the group of memory cells was successful. The error read flow component can further cause a counter corresponding to each of the plurality of read recovery operations to be incremented in response to a determination that the particular read recovery operation invoking the group of memory cells was successful.


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