The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 12, 2023

Filed:

Sep. 01, 2021
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventors:

Marco Pretorius, Oberkochen, DE;

Lars-Christian Wittig, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0032 (2013.01); G02B 21/367 (2013.01); G06T 2207/10056 (2013.01);
Abstract

An arrangement for light sheet microscopy contains an illumination objective for illuminating a sample located on a slide in a medium with a light sheet, a detection objective, a separation layer system, a first adaptive optical detection correction element, and a further adaptive optical detection correction element and/or a first adaptive optical illumination correction element, and optionally, a further adaptive optical illumination correction element. The arrangement contains an adjustment device for the controlled movement of the first detection correction element and of the further detection correction element and/or of the first illumination correction element and of the further illumination correction element; and a control unit, to generate control commands and to actuate the adjustment devices by means of the control commands such that aberrations are reduced. Corresponding objectives and a corresponding method for reducing aberrations can be used.


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