The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 05, 2023

Filed:

Aug. 03, 2021
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventor:

Steven George Hansen, Chandler, AZ (US);

Assignee:

ASML NETHERLANDS B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/398 (2020.01); G06F 119/18 (2020.01); G03F 7/00 (2006.01); G06F 30/30 (2020.01); G06F 30/367 (2020.01); G03F 1/70 (2012.01);
U.S. Cl.
CPC ...
G03F 7/705 (2013.01); G03F 1/70 (2013.01); G03F 7/70625 (2013.01); G03F 7/70666 (2013.01); G06F 30/30 (2020.01); G06F 30/367 (2020.01); G06F 30/398 (2020.01); G06F 2119/18 (2020.01);
Abstract

A method of determining a relationship between a stochastic variation of a characteristic of an aerial image or a resist image and one or more design variables, the method including: measuring values of the characteristic from a plurality of aerial images and/or resist images for each of a plurality of sets of values of the design variables; determining a value of the stochastic variation, for each of the plurality of sets of values of the design variables, from a distribution of the values of the characteristic for that set of values of the design variables; and determining the relationship by fitting one or more parameters from the values of the stochastic variation and the plurality of sets of values of the design variables.


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