The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
Jan. 26, 2022
Advantest Test Solutions, Inc., San Jose, CA (US);
Gregory Cruzan, San Jose, CA (US);
Karthik Ranganathan, San Jose, CA (US);
Gilberto Oseguera, San Jose, CA (US);
Joe Koeth, San Jose, CA (US);
Paul Ferrari, San Jose, CA (US);
James Hastings, San Jose, CA (US);
Chee Wah Ho, San Jose, CA (US);
Advantest Test Solutions, Inc., San Jose, CA (US);
Abstract
Embodiments of the present invention provide testing systems with liquid cooled thermal arrays that can pivot freely in three dimensions allowing surfaces to be brought into even, level, and secure contact, thereby preventing air gaps between surfaces and improving thermal performance. In this way, more DUTs can be tested in parallel within a small test space, overall costs of the test system are reduced, and greater cooling capacity can be provided for testing high-powered devices. Gimbaled mounts are disposed on a bottom surface of individual thermal interface boards (TIBs) of a test system, and/or on top of individual thermal heads of a thermal array (TA) having a common cold plate (or having multiple cold plates).