The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 05, 2023
Filed:
May. 26, 2023
Applicant:
Rigaku Corporation, Tokyo, JP;
Inventors:
Assignee:
Rigaku Corporation, Akishima, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); A61B 6/00 (2006.01);
U.S. Cl.
CPC ...
A61B 6/48 (2013.01); A61B 6/54 (2013.01); G01N 23/223 (2013.01);
Abstract
By regarding total precision of an X-ray intensity as counting precision due to statistical fluctuation and counting loss and by regarding the counting precision as a product of precision of an uncorrected intensity, which is an intensity before counting loss correction is performed, and a gradient of a corrected intensity with respect to the uncorrected intensity, a counting time calculation unit () included in an X-ray fluorescence spectrometer of the present invention calculates a counting time from specified total precision of the X-ray intensity, a given counting loss correction coefficient, and a given corrected intensity for each measurement line ().