The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 28, 2023

Filed:

Dec. 28, 2021
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventor:

Baokang Wang, Kanagawa, JP;

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/4076 (2006.01); H01L 25/065 (2023.01); G11C 11/4096 (2006.01);
U.S. Cl.
CPC ...
G11C 11/4076 (2013.01); G11C 11/4096 (2013.01); H01L 25/0657 (2013.01); H01L 2225/06541 (2013.01);
Abstract

Apparatuses, systems, and methods for data timing alignment in stacked memory. The memory a number of core dice stacked on an interface die. The core and interface die each include adjustable delay circuits along each of a delay and native path. A state machine operates interface and core aligner control circuits to set values of the delay(s) in the interface and core dice respectively. The state machine may initialize the delays and then enter a maintenance state where averaging is used to determine when to adjust the delay in the core dice. If an overflow or underflow condition is met, the state machine may cycle between adjusting the delay in the interface die and adjusting the delays in the core dice without averaging until the overflow and underflow conditions are no longer met and the maintenance state is returned to.


Find Patent Forward Citations

Wang, Baokang. (2023). Apparatuses, systems, and methods for data timing alignment in stacked memory (U.S. Patent No. 11830538). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11830538

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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