The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Jan. 15, 2021
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G01B 11/00 (2006.01); G06T 7/80 (2017.01); G02B 21/36 (2006.01); G06T 7/11 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G01B 11/002 (2013.01); G02B 21/36 (2013.01); G06T 7/11 (2017.01); G06T 7/80 (2017.01); G06T 2207/10056 (2013.01);
Abstract
An overview image of a sample carrier is obtained in a method for ascertaining a measurement location of a microscope. A mapping or homography is determined, by means of which the overview image is perspectively convertible into a plan view image on the basis of a height of the sample carrier. The measurement location is identified, with the aid of the determined mapping/homography, in the overview image or in an output image derived therefrom.