The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 28, 2023
Filed:
Nov. 06, 2018
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventor:
Lars Stoppe, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 5/50 (2006.01); G06T 7/33 (2017.01); G02B 21/36 (2006.01); H04N 23/74 (2023.01); G06V 10/141 (2022.01); G06V 10/98 (2022.01); G06V 10/10 (2022.01);
U.S. Cl.
CPC ...
G06T 5/50 (2013.01); G02B 21/365 (2013.01); G06T 7/33 (2017.01); G06V 10/141 (2022.01); G06V 10/98 (2022.01); H04N 23/74 (2023.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20216 (2013.01); G06V 10/16 (2022.01);
Abstract
Images are captured with a sample object in various arrangements relative to lighting and a detector. The images are then combined image point by image point on the basis of a comparison of image point values of image points of said images. This achieves a reduction in interference, i.e. reflections and/or shadows can be reduced.