The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Jan. 13, 2023
Guangdong University of Technology, Guangzhou, CN;
Zhuojun Zheng, Guangzhou, CN;
Jian Gao, Guangzhou, CN;
Lanyu Zhang, Guangzhou, CN;
Haixiang Deng, Guangzhou, CN;
Yun Chen, Guangzhou, CN;
Xin Chen, Guangzhou, CN;
GUANGDONG UNIVERSITY OF TECHNOLOGY, Guangzhou, CN;
Abstract
A three-dimensional measurement method comprises: converting a total number of levels of sawtooth fringes into a Gray code and acquiring a sawtooth slope coefficient; fusing the coefficient into a sawtooth fringe image to generate a target sawtooth fringe pattern; projecting each target sawtooth fringe pattern to a surface of a to-be-measured object through a projector, and collecting a deformed target sawtooth fringe pattern on the surface through a camera; solving a Gray code of each sawtooth fringe collection pattern at each pixel point according to a differential property of adjacent pixels in each sawtooth fringe collection pattern and solving a fringe level and a wrapped phase at each pixel point; calculating an absolute phase at each pixel point according to the fringe level and the wrapped phase at each pixel point, and reconstructing a three-dimensional point cloud through triangulation ranging to obtain a three-dimensional model of the to-be-measured object.