The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Oct. 14, 2020
Applicant:
Carl Zeiss X-ray Microscopy Inc., Pleasanton, CA (US);
Inventors:
Lars Omlor, Pleasanton, CA (US);
Hauyee Chang, Pleasanton, CA (US);
Assignee:
CARL ZEISS X-RAY MICROSCOPY INC., Dublin, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/20 (2006.01); G01N 23/2252 (2018.01); G21K 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 23/2252 (2013.01); G21K 7/00 (2013.01); H01J 37/20 (2013.01); G01N 2223/1016 (2013.01); G01N 2223/418 (2013.01);
Abstract
A collision avoidance system and method for an x-ray CT microscope processes image data of an object at different angles and generates a model of the object. This model is then used to configure the microscope for operation and possibly avoid collisions between the microscope and the object.