The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 21, 2023
Filed:
Sep. 30, 2021
Fei Company, Hillsboro, OR (US);
Andrew M. Kingston, Kambah, AU;
Shane Latham, Griffith, AU;
Adrian Sheppard, Fisher, AU;
Glenn Myers, Waramanga, AU;
Trond Karsten Varslot, Vuku, NO;
FEI Company, Hillsboro, OR (US);
Abstract
A method of investigating a specimen using tomographic imaging, comprising the steps of providing a specimen and a source, directing a beam of radiation from said source to said specimen, and detecting a flux of radiation transmitted through said specimen. The method further comprises the steps of moving at least one of said specimen and said source for providing relative motion of the source with respect to the specimen; and imaging the specimen along a series of different viewing axes, which intersect a virtual reference surface that surrounds the specimen and is substantially centered thereon, wherein said combined steps of moving and imaging generate a sampling geometry on said virtual reference surface. As defined herein, the steps of moving and imaging are coordinated in such a way that said sampling geometry comprises a plurality of spaced apart line segments.