The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 14, 2023

Filed:

Feb. 19, 2019
Applicant:

Life Technologies Corporation, Carlsbad, CA (US);

Inventors:

Zheng Zhang, Pasadena, CA (US);

Danwei Guo, San Mateo, CA (US);

Yuandan Lou, Cupertino, CA (US);

Asim Siddiqui, San Francisco, CA (US);

Dumitru Brinza, San Mateo, CA (US);

Assignee:

Life Technologies Corporation, Carlsbad, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G16B 30/10 (2019.01); G16B 30/00 (2019.01); G16B 30/20 (2019.01);
U.S. Cl.
CPC ...
G16B 30/10 (2019.02); G16B 30/00 (2019.02); G16B 30/20 (2019.02);
Abstract

Nucleic acid sequence mapping/assembly methods are disclosed. The methods initially map only a contiguous portion of each read to a reference sequence and then extends the mapping of the read at both ends of the mapped contiguous portion until the entire read is mapped (aligned). In various embodiments, a mapping score can be calculated for the read alignment using a scoring function, score (i, j)=M+mx, where M can be the number of matches in the extended alignment, x can be the number of mismatches in the alignment, and m can be a negative penalty for each mismatch. The mapping score can be utilized to rank or choose the best alignment for each read.


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