The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 14, 2023
Filed:
Oct. 04, 2021
Applicant:
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Inventors:
Matthew Andrew, Livermore, CA (US);
William Thompson, Livermore, CA (US);
Assignee:
Carl Zeiss X-ray Microscopy, Inc., Dublin, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/00 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01); G01N 23/046 (2018.01);
U.S. Cl.
CPC ...
G06T 11/006 (2013.01); G01N 23/046 (2013.01); G06T 5/002 (2013.01); G06T 5/20 (2013.01); G01N 2223/304 (2013.01); G01N 2223/42 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20192 (2013.01); G06T 2211/421 (2013.01); G06T 2211/424 (2013.01);
Abstract
A x-ray micro tomography system provides the ability to proscriptively determine regularization parameters for iterative reconstruction of a sample, from projection data of the sample. This allows a less experienced operator to determine the regularization parameters with adequate precision.